ICT Programming Solutions

1) We have the know-how to customize test plan to provide value-add to our customers.
2) We keep ourselves abreast with the latest technology to provide the expertise to overcome the challenges in this technology based industry:

• NAND flash programming; inaccessible devices around the cluster of NAND flash can be tested through the NAND flash test techniques
• NOR/Serial Flash/EEPROM programming, including dynamic data programming with the use of bar code scanning
• CPLD/FPGA programming
• Custom Micro controller tests through the close collaboration with our customers
• Boundary Scan Chain (eg. 1149.1, 1149.6) testing
• With specific reference to Agilent Tester, we can provide vectorless test to devices through the use of boundary scan test techniques, where applicable, ie. Cover Extend Technology (CET)
• NAND Tree/XOR Tree testing where available

3) We work closely with our customers to explore new test techniques specific to their challenges.

• We have implemented low resistance tests whose values are down to 5m ohm when the standard tester specification could not allow us to do so.
• We have implemented low resistance tests whose values are down to 5m ohm when the standard tester specification could not allow us to do so.
• We can maximize the test coverage in a limited access environment.
• We can integrate special measurements into test fixtures where external measuring instruments are required.