Test Probes
Product Range
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
- Board Test Probes (ICT / FCT)
- Thermocouple Probes
- Threaded Probes
- Receptacle
- Double-Ended Test Probes
- Wire Harness Probes
- Interface Contacts
- Wafer Level Test Probes (WLCSP)
- Rotator Probes
- Coaxial / RF Probes
- Fine-Pitch Probes (From 0.15 mm pitch)
- Backend Test Probes
- Celsius / Dyno Probes
- High Speed Test Probes
- Kelvin Test Probes
- Switch Probes
- High Current Test Probes
Test Sockets
World’s most comprehensive offering of spring probe based solutions, including: contacts, connectors, interposers, semiconductor test sockets, and ATE interfaces. Proven off-the-shelf and custom products deliver the best solution for the customer’s specific application
Area Array Test
Package on Package Test
Peripheral Package Test
Plastronics | Burn-in Test Sockets
Wafer Level Test
Area Array Test
Package on Package Test
Peripheral Package Test
Plastronics | Burn-in Test Sockets
Wafer Level Test
Technical Matters
By understanding the various types of probes and selecting the right tool for the application, technicians and engineers can achieve optimal results in a wide range of testing scenarios, from simple diagnostics to complex research applications.