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Smiths Interconnect Silmat Array Test Socket

A specialized component designed for semiconductor testing applications. Here are the key features and aspects of the Silmat Array Test Socket:

  • Electrically transparent contact
  • Low and stable contact resistance
  • High frequency bandwidth > 80 GHz
  • Signal path length < 1 mm
  • High temperature 155°C

Petracarbon - Smiths Interconnect