Our Products

Features

• Proprietary engineered plastic and machined ceramic for improved planarity allowing increased site-to-site test parallelism
• Customized footprint with component clearance close to the Device Under Test (DUT)
• Probe Head to PCB alignment by guide pins with optional fiducials
• Lid design options include individual spring-loaded device plungers and floating device guide
• Easy maintenance and quick installation
• Field repairable
• Compatible with industry-standard interval cleaning

Benefits

• Long product life
• Increased test throughput
• Higher signal integrity performance
• Reduced test set-up time
• Lower cost of ownership